The new WaveRunner 8000 combines a superior oscilloscope experience with an extensive toolbox to shorten debug time. MAUI with OneTouch includes the most unique touch features on any oscilloscope providing unsurpassed efficiency in oscilloscope operation. 500 MHz – 4 GHz of bandwidth, 40 GS/s sample rate, long memory, and a versatile toolset make the WaveRunner 8000 unbelievably powerful and incredibly easy to use.
Superior User Experience with OneTouch
The WaveRunner 8000 with MAUI OneTouch sets the standard for oscilloscope user experience by providing the most unique touch features on any oscilloscope. Familiar touchscreen gestures are used to instinctively interact with the oscilloscope and dramatically reduce setup time. Convenience and efficiency are optimized – all common operations can be performed with one touch and do not require opening and closing of pop-up dialogs or menus.
MAUI with OneTouch introduces a new paradigm for oscilloscope user experience. Dramatically reduce setup time with revolutionary drag and drop actions to copy and set up channels, math functions, and measurement parameters without lifting a finger. Use common gestures like drag, drop, and flick to instinctively interact with the oscilloscope. Quickly enable a new channel, math or measurement using the “Add New” button and simply turn off any trace or parameter with a flick of the finger. These OneTouch innovations provide unsurpassed efficiency in oscilloscope operation.
A. Channel, timebase, and trigger descriptors provide easy access to controls without navigating menus
B. Configure parameters by touching measurement results
C. Shortcuts to commonly used functions are displayed at the bottom of the channel, math and memory menus.
D. Use the “Add New” button for one-touch trace creation
E. Drag to change source, copy set up,turn on new trace, or move waveform location
F. Drag to copy measurement parameters to streamline setup process
G. Drag to quickly position cursors on a trace
Exceptional Serial Data Analysis
A wide variety of application packages is available to meet all serial data test challenges, ranging from automated compliance packages to flexible debug toolkits. A suite of protocol specific measurement and eye diagram packages is available to complement the industry’s most intuitive trigger and decode packages.
Isolate events using the serial bus trigger and view color-coded protocol information on top of analog or digital waveforms. Timing and bus measurements allow quick and easy characterization of a serial data system. Measurement data can be graphed to monitor system performance over time. Identify physical layer anomalies with eye diagram mask testing and mask failure locator.
Unleash the power of serial data analysis to understand and characterize a design, proving compliance, and explain why a device or host fails compliance. The SDAII architecture provides fast updates and eye diagram creation. Combined with up to 128 Mpts record lengths and complete jitter decomposition tools, SDA II provides a fast and complete understanding of why serial data fails a compliance test.
Very Powerful, Deep Toolbox
The standard collection of math, measurement, debug, and documentation tools provides unsurpassed analysis capabilities. Application-specific packages enable streamlined debugging for common design/validation scenarios. The advanced customization option enables user-defined parameters and math functions providing unique and limitless analysis capability.
Teledyne LeCroy’s 50+ year heritage has its origins in the high-speed collection of data in the field of high-energy physics, and the processing of long records to extract meaningful information. We didn’t invent the oscilloscope, but we did invent the digital oscilloscope, which can take full advantage of advanced digital signal processing and waveshape analysis tools to provide unparalleled insight.
Powerful Mixed-Signal Capabilities
The 16 integrated digital channels and set of tools designed to view, measure and analyze analog and digital signals enable fast debugging of mixed-signal designs. Using the powerful parallel pattern search capability of WaveScan, patterns across many digital lines can be isolated and analyzed. Identified patterns are presented in a table with time-stamped information, speeding up the search for each pattern occurrence. Use a variety of the many timing parameters to measure and analyze the characteristics of digital buses. Powerful tools like tracks, trends, statistics and histicons provide additional insight and help to detect anomalies.
Advanced Customization
With the XDEV option, third party programs can be completely integrated into the oscilloscope’s processing stream. Create customized math functions and parameters using C/C++, MATLAB, Excel, JScript or Visual Basic without leaving the oscilloscope application – and view the results directly on the oscilloscope, in real-time.
