High-end camera series ImageIR® from InfraTec helps to detect temperature differences in the milli-Kelvin and micro-Kelvin range
Thermographic testing and measurement in the field of microelectronics is considered to be very technologically demanding. Therefore, you need a thermographic camera that offers excellent quality, robustness and innovative technology. This is what the high-end camera series ImageIR® from InfraTec stands for. All of its models have an excellent thermal resolution up to 0.015 K, very high frame rates up to 25,000 Hz, and extremely short integration times in the microsecond range. Cooled focal-plane array photon detectors of different types (InSb and MCT) are used, that work in snapshot mode.
Full HD, Full Satisfaction
The ImageIR® 10300, top model of the high-end ImageIR® series, is the world’s first radiometric camera with a cooled detector of (1,920 × 1,536) IR pixels for industry and science. It opens the door to create thermograms with unprecedented image details and sharpness. At the same time the geometric resolution of greater than 3 Megapixels translates to a substantial increase in efficiency of testing extremely small micron sized structures on large targets.
Users do also benefit from the 10 GigE interface. This connection allows to transfer data ten times faster to a computer than with the conventional GigE interface. The data rate of 10 Gbit/s allows significantly higher frame rates while in full-frame mode. As a result the ImageIR® 10300 achieves a full-frame transfer rate of up to 100 Hz. Due to modern fiber optic cable technology the connection is completely immune to electromagnetic interference and can extend over distances from several meters to tens of kilometers.
One Series – Endless Possibilities
Even in their stand-alone versions, the models of the ImageIR® Series are powerful thermographic systems. The true flexibility of these high-quality thermal imaging cameras is especially evident in the possibilities they offer by their complete package systems. Superior infrared precision optics, robust control and analysis software coupled with various trigger and flexible integration options provide users with unlimited capabilities to manage measurement and testing tasks in the fields of electronics successfully.
Using Active Thermography to Analyse Structures of Electronic Components
If you want to take your product development and quality control to the next level, ImageIR® series qualifies perfectly. It enables to detect abnormal temperature distribution via lock-in thermography on a PCB surface, in IC’s, stacked-die packages and multi-chip modules. This helps to determine smallest defects like point and line shunts, oxide failures, transistor and diode failures – whether users are testing in-line during the manufacturing process or in laboratory.
Minimum thermal differences between defective and fully functional areas are one reason why it is so difficult to determine the exact location of defects. The camera series ImageIR® with a thermal resolution of less than 0.015 K offers perfect conditions for contactless and non-destructive measurement of temperature distribution on complex electronic assemblies and components. Developed and manufactured at InfraTec headquarters in Germany, it can be equipped with a wide range of powerful macro and wide-angle lenses. Depending on the lens, structures of just 1.3 µm can be analysed.
In addition to the question of where abnormalities are located, the measurement period plays a decisive role in many investigations. Special tests can take several hours or even days to complete. For these cases, high-quality Stirling coolers of ImageIR® series guarantee a maintenance-free, long-term and low-vibration operation. Up to 10,000 hours of operation can be achieved with these latest generation long-life coolers.
Choose the Right Software
Temperature differences in defective and intact structures often account for only a few milli-Kelvin and micro-Kelvin. Thermography software IRBIS® 3 active is a sufficient tool for such ambitious material testing. It supports lock-in thermography with active electrical excitation of corresponding testing objects for the detection of defects and provides crucial benefit to your entire manufacturing chain. The software enables analysis with different active thermography methods. It offers superimposition of different views at the pixel level to pinpoint abnormalities at their location successfully and precisely. To gain more detailed information you can use high-frequency excitation during your measurements. Users can easily save, neatly organize and quickly retrieve various parameter settings, which provides a convenient operation of IRBIS® 3 active in daily life.
Software, cameras, excitation sources, controllers, lenses – InfraTec offers a high quality stock of everything you need for testing electronic components based on more than 25 years of experience in applied thermography. We support you producing even better products.
