A compliance test application for systems using low-power double-data-rate 3 memory has been developed by Agilent Technologies Inc.
In addition to accelerating the turn-on and debug of LPDDR3-based systems, the tool enables engineers working with non-standard operating speeds and voltages to characterise their LPDDR3 designs.
The company’s U7231B LPDDR3 test application, which runs on Infiniium 9000, 90000A and 90000 X-Series oscilloscopes, provides LPDDR3 physical-layer compliance measurements. Signal access is provided by LPDDR3 BGA probes.
LPDDR3 is a type of dynamic random-access memory technology optimised for embedded and mobile applications. This is ideal for mobile devices such as smartphones, due to its low-power requirements.
LPDDR3 DRAM, with data rates up to 1600MT/s, is claimed to be 50 percent faster than current LPDDR2 DRAM. The test application is aimed at engineers who work on smartphones, tablets, gaming consoles and other consumer electronics.
The solution provides automated testing capabilities for clock, electrical and timing tests. Also the application automatically configures the oscilloscope for each test and generates an HTML report at the end of the test.
The report compares the results with the specified test limit and indicates how closely the device passes or fails each test.
Engineers can debug signal integrity issues using the U7231B software in conjunction with new InfiniiScan multichannel and multizone triggering scope features. The solution is designed to help engineers test under non standard conditions to obtain accurate results.
Agilent Technologies Inc.
